Informasi Produk & Harga Hubungi :
Contact Person
Nama : Rizki
HP / Whatshapp : 087820133836
Tel Kantor : 021-58909739
Fax : 021-29449921
Email : hutamasurveying@yahoo.com
Pin Blacberry : 5D701BAA
Alamat : Jl. Taman Alfa Indah Blok F.6 No.4, Kembangan, 11640, Indonesia
Detail Produk Leica Auto Level NA 332
Key Benefits:
- Quick and easy measurements
- Unique design and highest quality of results for levelling needs
- Manufactured for the most rugged sites and the harshest conditions
- Expert knowledge of Leica Geosystems with more than 270 service centres worldwide
- Unbeaten service offering
| Leica |
NA320 |
NA324 |
NA332 |
| Standard deviation for 1 km double levelling (ISO17123-2) |
2.5 mm |
2.0 mm |
1.8 mm |
| Telescope |
|
| Telescope image |
upright |
| Magnification |
20 x |
24 x |
32 x |
| Objective aperture |
36 mm |
| Shortest target distance from instrument axis |
< 1.0 m |
| Field of view at 100 m |
< 2.1 m |
| Multiplication factor |
100 |
| Additive constant 0 |
0 |
| Compensator |
|
| Working range |
± 15’ |
| Setting accuracy (standard deviation) |
< 0.5’’ |
| Sensitivity |
8’ / 2 mm |
| Horizontal circle |
|
| Graduation |
360° |
| Graduation interval |
1° |
| Weight (net) |
1.5 kg |
| Operating temperature range |
–20°C to +40°C |
|
|
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